1673-159X

CN 51-1686/N

Ba1-xBix(Ti0.9Zr0.1)O3陶瓷的介电弛豫特征

Dielectric Relaxation Properties of Ba1-xBix(Ti0.9Zr0.1)O3 Ceramics

  • 摘要: 采用固相反应法制备了Ba1-xBix(Ti0.9Zr0.1)O3(x=0.01, 0.02, 0.03, 0.04)陶瓷, X射线衍射分析表明所有样品均是四方晶体结构, 3% mol的Bi3+能够完全溶入钙钛矿晶格中。不同频率下Ba1-xBix(Ti0.9Zr0.1)O3陶瓷的介电温谱显示所有样品均表现出弥散相变的特征, 在x≥0.02的三组样品又表现出弛豫铁电体的特征。通过纳米极性微区和畴壁探讨了弛豫现象产生的机理。

     

    Abstract: Ba1-xBix(Ti0.9Zr0.1)O3(x=0.01, 0.02, 0.03, 0.04) ceramics is prepared by a conventional ceramics preparation technique. X-ray diffraction analysis indicates that all of the ceramics samples are tetragonal crystal structure, and 3% mol of Bi3+ doping can be fully incorporated into the perovskite lattice. The dielectric constants as a function of temperature at different frequencies show that all of the ceramics have characteristics of ferroelectrics with diffused phase transition, and the ceramics sample of x ≥ 0.02 exhibits typical relaxor ferroelectric characteristic. The relaxor characteristics are discussed according to polar nano-microregion and domain wall.

     

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